Strained Interface Defects in Silicon Nanocrystals Journal Article uri icon

Overview

publication date

  • August 7, 2012

Date in CU Experts

  • March 13, 2015 6:11 AM

Full Author List

  • Lee BG; Hiller D; Luo J-W; Semonin OE; Beard MC; Zacharias M; Stradins P

author count

  • 7

citation count

  • 56

Other Profiles

International Standard Serial Number (ISSN)

  • 1616-301X

Electronic International Standard Serial Number (EISSN)

  • 1616-3028

Additional Document Info

start page

  • 3223

end page

  • 3232

volume

  • 22

issue

  • 15