Reliability of Orientational Order Parameters Determined from Two-dimensional X-ray Diffraction Patterns: A Simulation Study Journal Article uri icon

Overview

publication date

  • June 3, 2016

Date in CU Experts

  • June 10, 2016 5:46 AM

Full Author List

  • Jenz F; Jagiella S; Glaser MA; Giesselmann F

author count

  • 4

citation count

  • 6

Other Profiles

International Standard Serial Number (ISSN)

  • 1439-4235

Electronic International Standard Serial Number (EISSN)

  • 1439-7641

Additional Document Info

start page

  • 1568

end page

  • 1572

volume

  • 17

issue

  • 11