Interfacial thermal conductance across metal-insulator/semiconductor interfaces due to surface states Journal Article uri icon

Overview

publication date

  • February 22, 2016

has restriction

  • hybrid

Date in CU Experts

  • November 2, 2017 1:24 AM

Full Author List

  • Lu T; Zhou J; Nakayama T; Yang R; Li B

author count

  • 5

citation count

  • 21

Other Profiles

International Standard Serial Number (ISSN)

  • 2469-9950

Electronic International Standard Serial Number (EISSN)

  • 2469-9969

Additional Document Info

volume

  • 93

issue

  • 8

number

  • ARTN 085433