Profiling Nanowire Thermal Resistance with a Spatial Resolution of Nanometers Journal Article uri icon

Overview

publication date

  • February 1, 2014

has restriction

  • closed

Date in CU Experts

  • December 8, 2017 2:45 AM

Full Author List

  • Liu D; Xie R; Yang N; Li B; Thong JTL

author count

  • 5

citation count

  • 49

Other Profiles

International Standard Serial Number (ISSN)

  • 1530-6984

Electronic International Standard Serial Number (EISSN)

  • 1530-6992

Additional Document Info

start page

  • 806

end page

  • 812

volume

  • 14

issue

  • 2