A universal gauge for thermal conductivity of silicon nanowires with different cross sectional geometries Journal Article uri icon

Overview

publication date

  • November 28, 2011

Date in CU Experts

  • December 8, 2017 2:46 AM

Full Author List

  • Chen J; Zhang G; Li B

author count

  • 3

citation count

  • 41

Other Profiles

International Standard Serial Number (ISSN)

  • 0021-9606

Electronic International Standard Serial Number (EISSN)

  • 1089-7690

Additional Document Info

volume

  • 135

issue

  • 20

number

  • ARTN 204705