Thermal contact resistance across nanoscale silicon dioxide and silicon interface Journal Article uri icon

Overview

publication date

  • September 15, 2012

has restriction

  • green

Date in CU Experts

  • December 8, 2017 2:46 AM

Full Author List

  • Chen J; Zhang G; Li B

author count

  • 3

citation count

  • 90

Other Profiles

International Standard Serial Number (ISSN)

  • 0021-8979

Electronic International Standard Serial Number (EISSN)

  • 1089-7550

Additional Document Info

volume

  • 112

issue

  • 6

number

  • ARTN 064319