Thermal Interface Conductance Between Aluminum and Silicon by Molecular Dynamics Simulations Journal Article uri icon

Overview

publication date

  • February 1, 2015

has restriction

  • green

Date in CU Experts

  • December 8, 2017 2:46 AM

Full Author List

  • Yang N; Luo T; Esfarjani K; Henry A; Tian Z; Shiomi J; Chalopin Y; Li B; Chen G

author count

  • 9

citation count

  • 53

Other Profiles

International Standard Serial Number (ISSN)

  • 1546-1955

Electronic International Standard Serial Number (EISSN)

  • 1546-1963

Additional Document Info

start page

  • 168

end page

  • 174

volume

  • 12

issue

  • 2