Tunable Charge-Trap Memory Based on Few-Layer MoS2

• Best Open Access

Overview

CU Boulder Authors

• Beard, Matthew C

publication date

• January 1, 2015

has restriction

• green

Date in CU Experts

• December 22, 2017 10:54 AM

Full Author List

• Zhang E; Wang W; Zhang C; Jin Y; Zhu G; Sun Q; Zhang DW; Zhou P; Xiu F

author count

• 9

citation count

• 373

published in

• ACS Nano 

Other Profiles

International Standard Serial Number (ISSN)

• 1936-0851

Electronic International Standard Serial Number (EISSN)

• 1936-086X

Digital Object Identifier (DOI)

• https://doi.org/10.1021/nn5059419

Additional Document Info

start page

• 612

end page

• 619

volume

• 9

issue

• 1