Scaled distribution mapping: a bias correction method that preserves raw climate model projected changes Journal Article uri icon

Overview

publication date

  • June 6, 2017

Date in CU Experts

  • November 6, 2018 3:32 AM

Full Author List

  • Switanek MB; Troch PA; Castro CL; Leuprecht A; Chang H-I; Mukherjee R; Demaria EMC

author count

  • 7

citation count

  • 68

Other Profiles

International Standard Serial Number (ISSN)

  • 1027-5606

Electronic International Standard Serial Number (EISSN)

  • 1607-7938

Additional Document Info

start page

  • 2649

end page

  • 2666

volume

  • 21

issue

  • 6