Characterization of Elastic Modulus Across the (Al1-xScx)N System Using DFT and Substrate-Effect-Corrected Nanoindentation Journal Article uri icon

Overview

publication date

  • November 1, 2018

Date in CU Experts

  • December 6, 2018 2:44 AM

Full Author List

  • Wu D; Chen Y; Manna S; Talley K; Zakutayev A; Brennecka GL; Ciobanu CV; Constantine P; Packard CE

author count

  • 9

citation count

  • 11

Other Profiles

International Standard Serial Number (ISSN)

  • 0885-3010

Electronic International Standard Serial Number (EISSN)

  • 1525-8955

Additional Document Info

start page

  • 2167

end page

  • 2175

volume

  • 65

issue

  • 11