Dynamic R-ON Characterization Technique for the Evaluation of Thermal and OFF-State Voltage Stress of GaN Switches Journal Article uri icon

Overview

publication date

  • April 1, 2018

Full Author List

  • Cappello T; Santarelli A; Florian C

Other Profiles

Additional Document Info

start page

  • 3386

end page

  • 3398

volume

  • 33

issue

  • 4