Rare variant association test with multiple phenotypes Journal Article uri icon

Overview

publication date

  • April 1, 2017

has subject area

Date in CU Experts

  • December 10, 2019 9:07 AM

Full Author List

  • Lee S; Won S; Kim YJ; Kim Y; Kim B-J; Park T

author count

  • 6

citation count

  • 10

Other Profiles

International Standard Serial Number (ISSN)

  • 0741-0395

Electronic International Standard Serial Number (EISSN)

  • 1098-2272

Additional Document Info

start page

  • 198

end page

  • 209

volume

  • 41

issue

  • 3