Thermal Transport in 2D Semiconductors-Considerations for Device Applications Journal Article uri icon

Overview

publication date

  • February 19, 2020

has restriction

  • closed

Date in CU Experts

  • January 28, 2020 7:22 AM

Full Author List

  • Zhao Y; Cai Y; Zhang L; Li B; Zhang G; Thong JTL

author count

  • 6

citation count

  • 40

Other Profiles

International Standard Serial Number (ISSN)

  • 1616-301X

Electronic International Standard Serial Number (EISSN)

  • 1616-3028

Additional Document Info

volume

  • 30

issue

  • 8

number

  • ARTN 1903929