Coping with family stress in individuals at clinical high-risk for psychosis Journal Article uri icon

Overview

publication date

  • February 1, 2020

Date in CU Experts

  • July 21, 2020 6:07 AM

Full Author List

  • Yee C; Gupta T; Mittal VA; Haase CM

author count

  • 4

citation count

  • 5

Other Profiles

International Standard Serial Number (ISSN)

  • 0920-9964

Electronic International Standard Serial Number (EISSN)

  • 1573-2509

Additional Document Info

start page

  • 222

end page

  • 228

volume

  • 216