Simple fabrication scheme for sub-10 nm electrode gaps using electron-beam lithography Journal Article uri icon

Overview

publication date

  • February 4, 2002

has restriction

  • closed

Date in CU Experts

  • September 9, 2013 9:44 AM

Full Author List

  • Liu K; Avouris P; Bucchignano J; Martel R; Sun S; Michl J

author count

  • 6

citation count

  • 149

Other Profiles

International Standard Serial Number (ISSN)

  • 0003-6951

Electronic International Standard Serial Number (EISSN)

  • 1077-3118

Additional Document Info

start page

  • 865

end page

  • 867

volume

  • 80

issue

  • 5