publication venue for
- THICKNESS DEPENDENCE OF THE REFLECTION COEFFICIENT FROM THIN SEMICONDUCTOR-FILMS AND MEASUREMENTS OF THE CONDUCTIVITY 1982
- Measurement of the resistivity of thin CdS films on brass substrates 1980
- ELECTRONIC-STRUCTURE AND STABILITY OF SEMICONDUCTOR ALLOYS 1987
- WORK IN THE SOLID-STATE THEORY GROUP AT THE SOLAR-ENERGY-RESEARCH-INSTITUTE 1987