Analysis of trace impurities in semiconductor gas via cavity-enhanced direct frequency comb spectroscopy
Journal Article
Overview
publication date
- September 1, 2010
Full Author List
- Cossel KC; Adler F; Bertness KA; Thorpe MJ; Feng J; Raynor MW; Ye J
published in
Other Profiles
Digital Object Identifier (DOI)
Additional Document Info
start page
- 917
end page
- 924
volume
- 100
issue
- 4