Analysis of trace impurities in semiconductor gas via cavity-enhanced direct frequency comb spectroscopy Journal Article uri icon

Overview

publication date

  • September 1, 2010

Full Author List

  • Cossel KC; Adler F; Bertness KA; Thorpe MJ; Feng J; Raynor MW; Ye J

Other Profiles

Additional Document Info

start page

  • 917

end page

  • 924

volume

  • 100

issue

  • 4