Analysis of trace impurities in semiconductor gas via cavity-enhanced direct frequency comb spectroscopy Journal Article uri icon

Overview

publication date

  • September 1, 2010

Date in CU Experts

  • March 13, 2015 12:29 PM

Full Author List

  • Cossel KC; Adler F; Bertness KA; Thorpe MJ; Feng J; Raynor MW; Ye J

author count

  • 7

citation count

  • 28

Other Profiles

International Standard Serial Number (ISSN)

  • 0946-2171

Electronic International Standard Serial Number (EISSN)

  • 1432-0649

Additional Document Info

start page

  • 917

end page

  • 924

volume

  • 100

issue

  • 4