Application of high-resolution time-of-flight chemical ionization mass spectrometry measurements to estimate volatility distributions of alpha-pinene and naphthalene oxidation products Journal Article uri icon


publication date

  • January 1, 2015

Full Author List

  • Chhabra PS; Lambe AT; Canagaratna MR; Stark H; Jayne JT; Onasch TB; Davidovits P; Kimmel JR; Worsnop DR

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Additional Document Info

start page

  • 1

end page

  • 18


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