Errors in trapped-ion quantum gates due to spontaneous photon scattering Journal Article uri icon

Overview

publication date

  • April 1, 2007

has restriction

  • green

Date in CU Experts

  • March 13, 2015 1:19 AM

Full Author List

  • Ozeri R; Itano WM; Blakestad RB; Britton J; Chiaverini J; Jost JD; Langer C; Leibfried D; Reichle R; Seidelin S

author count

  • 12

citation count

  • 107

Other Profiles

International Standard Serial Number (ISSN)

  • 1050-2947

Electronic International Standard Serial Number (EISSN)

  • 1094-1622

Additional Document Info

volume

  • 75

issue

  • 4

number

  • ARTN 042329