Demonstration of a Dressed-State Phase Gate for Trapped Ions uri icon

Overview

publication date

  • June 26, 2013

has restriction

  • hybrid

Date in CU Experts

  • March 13, 2015 1:19 AM

Full Author List

  • Tan TR; Gaebler JP; Bowler R; Lin Y; Jost JD; Leibfried D; Wineland DJ

author count

  • 7

citation count

  • 42

Other Profiles

International Standard Serial Number (ISSN)

  • 0031-9007

Electronic International Standard Serial Number (EISSN)

  • 1079-7114

Additional Document Info

volume

  • 110

issue

  • 26

number

  • ARTN 263002