High-Fidelity Transport of Trapped-Ion Qubits through an X-Junction Trap Array uri icon

Overview

publication date

  • April 17, 2009

has restriction

  • green

Date in CU Experts

  • March 13, 2015 1:20 AM

Full Author List

  • Blakestad RB; Ospelkaus C; VanDevender AP; Amini JM; Britton J; Leibfried D; Wineland DJ

author count

  • 7

citation count

  • 101

Other Profiles

International Standard Serial Number (ISSN)

  • 0031-9007

Electronic International Standard Serial Number (EISSN)

  • 1079-7114

Additional Document Info

volume

  • 102

issue

  • 15

number

  • ARTN 153002