Simultaneous quantitative depth mapping and extended depth of field for 4D microscopy through PSF engineering Conference Proceeding uri icon


publication date

  • January 24, 2012

has restriction

  • closed

Date in CU Experts

  • March 13, 2015 3:48 AM

Full Author List

  • Zahreddine RN; Cormack RH; Cogswell CJ

Full Editor List

  • Conchello JA; Cogswell CJ; Wilson T; Brown TG

author count

  • 3

citation count

  • 5

Other Profiles

International Standard Serial Number (ISSN)

  • 0277-786X

Electronic International Standard Serial Number (EISSN)

  • 1996-756X

Additional Document Info


  • 8227