Simultaneous quantitative depth mapping and extended depth of field for 4D microscopy through PSF engineering Conference Proceeding

Overview

CU Boulder Authors

Cogswell, Carol

publication date

January 24, 2012

has restriction

closed

Date in CU Experts

March 13, 2015 3:48 AM

Full Author List

Zahreddine RN; Cormack RH; Cogswell CJ

Full Editor List

Conchello JA; Cogswell CJ; Wilson T; Brown TG

author count

3

citation count

5

published in

Proceedings of SPIE Journal

presented at event

Conference on Three-Dimensional and Multidimensional Microscopy - Image Acquisition and Processing XIX Conference

Other Profiles

International Standard Serial Number (ISSN)

0277-786X

Electronic International Standard Serial Number (EISSN)

1996-756X

Digital Object Identifier (DOI)

https://doi.org/10.1117/12.909273

Additional Document Info

volume

8227