Metrology for high-frequency nanoelectronics Conference Proceeding

Overview

CU Boulder Authors

• Nembach, Hans Toya

publication date

• March 27, 2007

Date in CU Experts

• March 13, 2015 3:51 AM

Full Author List

• Wallis TM; Imtiaz A; Nembach HT; Rice P; Kabos P

Full Editor List

• Seiler DG; Diebold AC; McDonald R; Garner CM; Herr D; Khosla RP; Secula EM

author count

• 5

citation count

• 3

published in

• AIP Conference Proceedings  Journal

presented at event

• International Conference on Frontiers of Characterization and Metrology for Nanoelectronics  Conference

Other Profiles

International Standard Serial Number (ISSN)

• 0094-243X

International Standard Book Number (ISBN) 13

• 978-0-7354-0441-0

Additional Document Info

start page

• 525

end page

• +

volume

• 931