Critical Transport in Weakly Disordered Semiconductors and Semimetals Journal Article uri icon

Overview

publication date

  • April 20, 2015

Date in CU Experts

  • May 15, 2015 3:15 AM

Full Author List

  • Syzranov SV; Radzihovsky L; Gurarie V

author count

  • 3

citation count

  • 88

Other Profiles

International Standard Serial Number (ISSN)

  • 0031-9007

Electronic International Standard Serial Number (EISSN)

  • 1079-7114

Additional Document Info

volume

  • 114

issue

  • 16

number

  • ARTN 166601