Characterization of Expected Multipath Error for the NICER X-Ray Telescope Payload Conference Proceeding uri icon

Overview

publication date

  • September 8, 2014

Date in CU Experts

  • August 13, 2015 12:24 PM

Full Author List

  • Klein V; Axelrad P; Veldman J

author count

  • 3

citation count

  • 1

Other Profiles

International Standard Serial Number (ISSN)

  • 2331-5911

Electronic International Standard Serial Number (EISSN)

  • 2331-5954

Additional Document Info

start page

  • 2448

end page

  • 2456