Record Surface State Mobility and Quantum Hall Effect in Topological Insulator Thin Films via Interface Engineering Journal Article uri icon

Overview

publication date

  • December 1, 2015

Date in CU Experts

  • November 26, 2015 4:16 AM

Full Author List

  • Koirala N; Brahlek M; Salehi M; Wu L; Dai J; Waugh J; Nummy T; Han M-G; Moon J; Zhu Y

author count

  • 14

citation count

  • 86

Other Profiles

International Standard Serial Number (ISSN)

  • 1530-6984

Electronic International Standard Serial Number (EISSN)

  • 1530-6992

Additional Document Info

start page

  • 8245

end page

  • 8249

volume

  • 15

issue

  • 12