Characterization of Thin Film Dissolution in Water with in Situ Monitoring of Film Thickness Using Reflectometry Journal Article uri icon

Overview

publication date

  • July 13, 2016

has restriction

  • closed

Date in CU Experts

  • July 1, 2016 5:40 AM

Full Author List

  • Yersak AS; Lewis RJ; Tran J; Lee YC

author count

  • 4

citation count

  • 5

Other Profiles

International Standard Serial Number (ISSN)

  • 1944-8244

Electronic International Standard Serial Number (EISSN)

  • 1944-8252

Additional Document Info

start page

  • 17622

end page

  • 17630

volume

  • 8

issue

  • 27