Characterization of Thin Film Dissolution in Water with in Situ Monitoring of Film Thickness Using Reflectometry Journal Article uri icon

Overview

publication date

  • July 13, 2016

Full Author List

  • Yersak AS; Lewis RJ; Tran J; Lee YC

Other Profiles

Additional Document Info

start page

  • 17622

end page

  • 17630

volume

  • 8

issue

  • 27