Automated extraction of model parameters for noise coupling analysis in silicon substrates
Conference Proceeding
Overview
publication date
- September 16, 2007
has restriction
- closed
Date in CU Experts
- September 19, 2016 1:23 AM
Full Author List
- Peterson B; Mayaram K; Fiez TS
author count
- 3
citation count
- 2
presented at event
- IEEE Custom Integrated Circuits Conference Conference
Other Profiles
Digital Object Identifier (DOI)
International Standard Book Number (ISBN) 13
- 978-1-4244-0786-6
Additional Document Info
start page
- 853
end page
- 856