Accurate prediction of substrate parasitics in heavily doped CMOS processes using a calibrated boundary element solver Journal Article uri icon

Overview

publication date

  • July 1, 2005

has restriction

  • closed

Date in CU Experts

  • September 19, 2016 1:24 AM

Full Author List

  • Sharma A; Birrer P; Arunachalam SK; Xu CG; Fiez TS; Mayaram K

author count

  • 6

citation count

  • 6

Other Profiles

International Standard Serial Number (ISSN)

  • 1063-8210

Electronic International Standard Serial Number (EISSN)

  • 1557-9999

Additional Document Info

start page

  • 843

end page

  • 851

volume

  • 13

issue

  • 7