MEASUREMENT OF ADHERENCE OF RESIDUALLY STRESSED THIN-FILMS BY INDENTATION .1. MECHANICS OF INTERFACE DELAMINATION Journal Article
Overview
publication date
- January 1, 1984
has restriction
- closed
Date in CU Experts
- January 19, 2017 4:31 AM
Full Author List
- MARSHALL DB; EVANS AG
author count
- 2
citation count
- 337
published in
- Journal of Applied Physics Journal
Other Profiles
International Standard Serial Number (ISSN)
- 0021-8979
Digital Object Identifier (DOI)
Additional Document Info
start page
- 2632
end page
- 2638
volume
- 56
issue
- 10