Curvature-Controlled Defect Localization in Elastic Surface Crystals Journal Article uri icon

Overview

publication date

  • March 7, 2016

Date in CU Experts

  • January 24, 2017 2:43 AM

Full Author List

  • Jimenez FL; Stoop N; Lagrange R; Dunkel J; Reis PM

author count

  • 5

citation count

  • 29

Other Profiles

International Standard Serial Number (ISSN)

  • 0031-9007

Electronic International Standard Serial Number (EISSN)

  • 1079-7114

Additional Document Info

volume

  • 116

issue

  • 10

number

  • ARTN 104301