Polymorphism influences singlet fission rates in tetracene thin films Journal Article uri icon

Overview

publication date

  • January 1, 2016

Date in CU Experts

  • March 13, 2017 3:52 AM

Full Author List

  • Arias DH; Ryerson JL; Cook JD; Damrauer NH; Johnson JC

author count

  • 5

citation count

  • 99

Other Profiles

International Standard Serial Number (ISSN)

  • 2041-6520

Electronic International Standard Serial Number (EISSN)

  • 2041-6539

Additional Document Info

start page

  • 1185

end page

  • 1191

volume

  • 7

issue

  • 2