Ultrafast thermoreflectance techniques for measuring thermal conductivity and interface thermal conductance of thin films Journal Article

Overview

CU Boulder Authors

Wang, Wei

publication date

November 1, 2010

Date in CU Experts

September 3, 2013 3:16 AM

Full Author List

Zhu J; Tang D; Wang W; Liu J; Holub KW; Yang R

author count

6

citation count

195

published in

Journal of Applied Physics Journal

Other Profiles

International Standard Serial Number (ISSN)

0021-8979

Electronic International Standard Serial Number (EISSN)

1089-7550

Digital Object Identifier (DOI)

https://doi.org/10.1063/1.3504213

Additional Document Info

volume

108

issue

9

number

ARTN 094315