Pd effect on reliability of Ag bonding wires in microelectronic devices in high-humidity environments Journal Article uri icon

Overview

publication date

  • October 1, 2012

has restriction

  • closed

Date in CU Experts

  • September 4, 2013 11:16 AM

Full Author List

  • Cho J-S; Yoo K-A; Moon J-T; Son S-B; Lee S-H; Oh KH

author count

  • 6

citation count

  • 19

Other Profiles

International Standard Serial Number (ISSN)

  • 1598-9623

Electronic International Standard Serial Number (EISSN)

  • 2005-4149

Additional Document Info

start page

  • 881

end page

  • 885

volume

  • 18

issue

  • 5