Reliability testing of flexible printed circuit-based RF MEMS capacitive switches Journal Article
Overview
publication date
- February 1, 2004
has restriction
- closed
Date in CU Experts
- September 4, 2013 11:18 AM
Full Author List
- Lee S; Ramadoss R; Buck M; Bright VM; Gupta KC; Lee YC
author count
- 6
citation count
- 42
published in
Other Profiles
International Standard Serial Number (ISSN)
- 0026-2714
Digital Object Identifier (DOI)
Additional Document Info
start page
- 245
end page
- 250
volume
- 44
issue
- 2