Reliability testing of flexible printed circuit-based RF MEMS capacitive switches Journal Article

Overview

CU Boulder Authors

publication date

February 1, 2004

Full Author List

Lee S; Ramadoss R; Buck M; Bright VM; Gupta KC; Lee YC

published in

Microelectronics Reliability Journal

Other Profiles

Digital Object Identifier (DOI)

10.1016/j.microrel.2003.09.002

Additional Document Info

start page

245

end page

250

volume

44

issue

2