Reliability testing of flexible printed circuit-based RF MEMS capacitive switches
Journal Article
Overview
publication date
- February 1, 2004
Full Author List
- Lee S; Ramadoss R; Buck M; Bright VM; Gupta KC; Lee YC
published in
- Microelectronics Reliability Journal
Other Profiles
Digital Object Identifier (DOI)
Additional Document Info
start page
- 245
end page
- 250
volume
- 44
issue
- 2