Reliability testing of flexible printed circuit-based RF MEMS capacitive switches Journal Article uri icon

Overview

publication date

  • February 1, 2004

Full Author List

  • Lee S; Ramadoss R; Buck M; Bright VM; Gupta KC; Lee YC

Other Profiles

Additional Document Info

start page

  • 245

end page

  • 250

volume

  • 44

issue

  • 2