Audiofrequency measurement of JFET noise versus temperature in a high-impedance preamplifier Journal Article uri icon



  • We describe a high-impedance audiofrequency preamplifier and present audiofrequency noise spectra for 2N4416 and U311 JFETs in a temperature range from room temperature to 80 K. It is found that optimum noise performance is obtained at −140°C. We present an analysis of some of the sources of noise. Amplifier input capacitance is also measured and discussed.

publication date

  • October 1, 1985

has restriction

  • green

Date in CU Experts

  • March 16, 2018 3:02 AM

Full Author List

  • Klein S; Innes W; Price JC

author count

  • 3

Other Profiles

International Standard Serial Number (ISSN)

  • 0034-6748

Electronic International Standard Serial Number (EISSN)

  • 1089-7623

Additional Document Info

start page

  • 1941

end page

  • 1945


  • 56


  • 10