Self-Contained Fragmentation and Interfacial Stability in Crude Micron-Silicon Anodes Journal Article uri icon

Overview

publication date

  • January 1, 2018

has restriction

  • closed

Date in CU Experts

  • June 14, 2018 10:37 AM

Full Author List

  • Heist A; Piper DM; Evans T; Kim SC; Han SS; Oh KH; Lee S-H

author count

  • 7

citation count

  • 6

Other Profiles

International Standard Serial Number (ISSN)

  • 0013-4651

Electronic International Standard Serial Number (EISSN)

  • 1945-7111

Additional Document Info

start page

  • A244

end page

  • A250

volume

  • 165

issue

  • 2