Thin film metrology and microwave loss characterization of indium and aluminum/indium superconducting planar resonators Journal Article uri icon

Overview

publication date

  • May 28, 2018

Date in CU Experts

  • June 28, 2018 9:57 AM

Full Author List

  • McRae CRH; Bejanin JH; Earnest CT; McConkey TG; Rinehart JR; Deimert C; Thomas JP; Wasilewski ZR; Mariantoni M

author count

  • 9

citation count

  • 5

Other Profiles

International Standard Serial Number (ISSN)

  • 0021-8979

Electronic International Standard Serial Number (EISSN)

  • 1089-7550

Additional Document Info

volume

  • 123

issue

  • 20

number

  • ARTN 205304