An optimal rule for patent damages under sequential innovation Journal Article uri icon

Overview

publication date

  • June 1, 2018

has restriction

  • closed

Date in CU Experts

  • July 19, 2018 11:14 AM

Full Author List

  • Chen Y; Sappington DEM

author count

  • 2

citation count

  • 3

Other Profiles

International Standard Serial Number (ISSN)

  • 0741-6261

Electronic International Standard Serial Number (EISSN)

  • 1756-2171

Additional Document Info

start page

  • 370

end page

  • 397

volume

  • 49

issue

  • 2