An optimal rule for patent damages under sequential innovation Journal Article
Overview
publication date
- June 1, 2018
has restriction
- closed
Date in CU Experts
- July 19, 2018 11:14 AM
Full Author List
- Chen Y; Sappington DEM
author count
- 2
citation count
- 3
published in
- RAND Journal of Economics Journal
Other Profiles
International Standard Serial Number (ISSN)
- 0741-6261
Electronic International Standard Serial Number (EISSN)
- 1756-2171
Digital Object Identifier (DOI)
Additional Document Info
start page
- 370
end page
- 397
volume
- 49
issue
- 2