PATENTABILITY, R&D DIRECTION, AND CUMULATIVE INNOVATION Journal Article uri icon

Overview

publication date

  • November 1, 2018

has restriction

  • closed

Date in CU Experts

  • December 6, 2018 2:44 AM

Full Author List

  • Chen Y; Pan S; Zhang T

author count

  • 3

citation count

  • 11

Other Profiles

International Standard Serial Number (ISSN)

  • 0020-6598

Electronic International Standard Serial Number (EISSN)

  • 1468-2354

Additional Document Info

start page

  • 1969

end page

  • 1993

volume

  • 59

issue

  • 4