Hardware Demonstration of Atomic Force Microscopy Imaging via Compressive Sensing and mu-path Scans Conference Proceeding uri icon

Overview

publication date

  • June 27, 2018

Date in CU Experts

  • January 25, 2019 9:11 AM

Full Author List

  • Braker RA; Luo Y; Pao LY; Andersson SB

author count

  • 4

citation count

  • 6

Other Profiles

International Standard Serial Number (ISSN)

  • 0743-1619

Electronic International Standard Serial Number (EISSN)

  • 2378-5861

Additional Document Info

start page

  • 6037

end page

  • 6042