Quantum confinement in amorphous TiO2 films studied via atomic layer deposition Journal Article uri icon

Overview

publication date

  • November 5, 2008

Date in CU Experts

  • September 6, 2013 11:56 AM

Full Author List

  • King DM; Du X; Cavanagh AS; Weimer A

author count

  • 4

citation count

  • 59

Other Profiles

International Standard Serial Number (ISSN)

  • 0957-4484

Electronic International Standard Serial Number (EISSN)

  • 1361-6528

Additional Document Info

volume

  • 19

issue

  • 44

number

  • ARTN 445401