High resolution damage imaging in flat and bent plate-like structures through Warped-Basis Pursuit Conference Proceeding uri icon

Overview

publication date

  • March 7, 2011

Date in CU Experts

  • August 1, 2019 4:33 AM

Full Author List

  • Baravelli E; De Marchi L; Ruzzene M; Speciale N

Full Editor List

  • Kundu T

author count

  • 4

Other Profiles

International Standard Serial Number (ISSN)

  • 0277-786X

Electronic International Standard Serial Number (EISSN)

  • 1996-756X

Additional Document Info

volume

  • 7984