High resolution damage imaging in flat and bent plate-like structures through Warped-Basis Pursuit Conference Proceeding
Overview
publication date
- March 7, 2011
has restriction
- closed
Date in CU Experts
- August 1, 2019 4:33 AM
Full Author List
- Baravelli E; De Marchi L; Ruzzene M; Speciale N
Full Editor List
- Kundu T
author count
- 4
published in
- Proceedings of SPIE Journal
presented at event
Other Profiles
International Standard Serial Number (ISSN)
- 0277-786X
Electronic International Standard Serial Number (EISSN)
- 1996-756X
Digital Object Identifier (DOI)
Additional Document Info
volume
- 7984