Analysis of an Electromagnetic Mitigation Scheme for Reentry Telemetry Through Plasma Journal Article uri icon

Overview

publication date

  • November 1, 2008

has restriction

  • green

Date in CU Experts

  • August 13, 2019 11:59 AM

Full Author List

  • Kim M; Keidar M; Boyd ID

author count

  • 3

Other Profiles

International Standard Serial Number (ISSN)

  • 0022-4650

Electronic International Standard Serial Number (EISSN)

  • 1533-6794

Additional Document Info

start page

  • 1223

end page

  • 1229

volume

  • 45

issue

  • 6