Microphysical Process Comparison of Three Microphysics Parameterization Schemes in the WRF Model for an Idealized Squall-Line Case Study Journal Article uri icon

Overview

publication date

  • September 1, 2019

Date in CU Experts

  • August 27, 2019 3:25 AM

Full Author List

  • Bao J-W; Michelson SA; Grell ED

author count

  • 3

citation count

  • 10

Other Profiles

International Standard Serial Number (ISSN)

  • 0027-0644

Electronic International Standard Serial Number (EISSN)

  • 1520-0493

Additional Document Info

start page

  • 3093

end page

  • 3120

volume

  • 147

issue

  • 9