Raman scattering spectra and electrical conductivity of thin silicon films with a mixed amorphous-nanocrystalline phase composition: Determination of the nanocrystalline volume fraction Journal Article uri icon

Overview

publication date

  • August 1, 1997

has restriction

  • closed

Date in CU Experts

  • November 14, 2019 10:24 AM

Full Author List

  • Golubev VG; Davydov VY; Medvedev AV; Pevtsov AB; Feoktistov NA

author count

  • 5

citation count

  • 41

Other Profiles

International Standard Serial Number (ISSN)

  • 1063-7834

Additional Document Info

start page

  • 1197

end page

  • 1201

volume

  • 39

issue

  • 8