Fixed-polarizer ellipsometry: a simple technique to measure the thickness of very thin films Journal Article uri icon

Overview

publication date

  • May 1, 1999

has restriction

  • closed

Date in CU Experts

  • September 6, 2013 12:32 PM

Full Author List

  • Trotter B; Moddel G; Ostroff R; Bogart GR

author count

  • 4

citation count

  • 10

Other Profiles

International Standard Serial Number (ISSN)

  • 0091-3286

Electronic International Standard Serial Number (EISSN)

  • 1560-2303

Additional Document Info

start page

  • 902

end page

  • 907

volume

  • 38

issue

  • 5