Fixed-polarizer ellipsometry: a simple technique to measure the thickness of very thin films Journal Article
Overview
publication date
- May 1, 1999
has restriction
- closed
Date in CU Experts
- September 6, 2013 12:32 PM
Full Author List
- Trotter B; Moddel G; Ostroff R; Bogart GR
author count
- 4
citation count
- 10
published in
- Optical Engineering Journal
Other Profiles
International Standard Serial Number (ISSN)
- 0091-3286
Electronic International Standard Serial Number (EISSN)
- 1560-2303
Digital Object Identifier (DOI)
Additional Document Info
start page
- 902
end page
- 907
volume
- 38
issue
- 5