Fixed-polarizer ellipsometry: a simple technique to measure the thickness of very thin films Journal Article uri icon

Overview

publication date

  • May 1, 1999

Full Author List

  • Trotter B; Moddel G; Ostroff R; Bogart GR

Other Profiles

Additional Document Info

start page

  • 902

end page

  • 907

volume

  • 38

issue

  • 5