Effects of Stiff Film Pattern Geometry on Surface Buckling Instabilities of Elastic Bilayers Journal Article uri icon

Overview

publication date

  • July 11, 2018

Date in CU Experts

  • October 18, 2020 8:03 AM

Full Author List

  • Ouchi T; Yang J; Suo Z; Hayward RC

author count

  • 4

citation count

  • 14

Other Profiles

International Standard Serial Number (ISSN)

  • 1944-8244

Electronic International Standard Serial Number (EISSN)

  • 1944-8252

Additional Document Info

start page

  • 23406

end page

  • 23413

volume

  • 10

issue

  • 27