Application of Automated Model Generation Techniques to Analog/Mixed-Signal Circuits Conference Proceeding

Overview

CU Boulder Authors

Myers, Christopher

publication date

December 5, 2007

has restriction

closed

Date in CU Experts

October 28, 2020 2:57 AM

Full Author List

Little S; Sen A; Myers C

author count

3

citation count

2

published in

Proceedings - International Workshop on Microprocessor Test and Verification Journal

presented at event

8th International Workshop on Microprocessor Test and Verification Conference

Other Profiles

International Standard Serial Number (ISSN)

1550-4093

Digital Object Identifier (DOI)

https://doi.org/10.1109/mtv.2007.17

International Standard Book Number (ISBN) 13

978-0-7695-3241-7

Additional Document Info

start page

109

end page

+