A New Verification Method For Embedded Systems Conference Proceeding

Overview

CU Boulder Authors

• Myers, Christopher

publication date

• October 4, 2009

has restriction

• closed

Date in CU Experts

• October 28, 2020 2:57 AM

Full Author List

• Thacker RA; Myers CJ; Jones K; Little SR

author count

• 4

citation count

• 3

published in

• IEEE International Conference on Computer Design - VLSI in Computers and Processors  Journal

presented at event

• 27th IEEE International Conference on Computer Design  Conference

Other Profiles

International Standard Serial Number (ISSN)

• 1063-6404

Digital Object Identifier (DOI)

• https://doi.org/10.1109/iccd.2009.5413154

International Standard Book Number (ISBN) 13

• 978-1-4244-5029-9

Additional Document Info

start page

• 193

end page

• +